Pay in 4 interest-free payments of $106.62 Learn more
Ships within 48 hours · Estimated delivery Aug 1 - Aug 6
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2
where the specifications are met through tight manufacturing tolerances and not by individual per die measurements
useful for EDX analysis
Recommended for use with Bruker Dimension FastScan AFM
Test Grating for Tip Sharpness Hysitron This AFM probe is unmountedDESCRIPTION The TGTZ 400 test grating is intended for 3 D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: 10nm Tip Height: 0. 3 0. 7m Period: 3 0. 01m Diagonal period: 2. 12m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 2 x 2mm
US$ 877.00
US$ 199.99
US$ 300.00
